Invention Application
US20150017456A1 Reducing voids caused by trapped acid on a dielectric surface
审中-公开
减少电介质表面上被捕获的酸引起的空隙
- Patent Title: Reducing voids caused by trapped acid on a dielectric surface
- Patent Title (中): 减少电介质表面上被捕获的酸引起的空隙
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Application No.: US13941841Application Date: 2013-07-15
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Publication No.: US20150017456A1Publication Date: 2015-01-15
- Inventor: Anh Duong , Clemens Fitz
- Applicant: Intermolecular Inc.
- Main IPC: H01L21/3105
- IPC: H01L21/3105 ; H01L21/66

Abstract:
When an etchant for metal (e.g., HF) reaches an underlying silicon oxide layer, it may form silanol bonds or other hydrogen bonds that resist rinsing, so that some etchant remains to be trapped under the next deposited layer. Trapped etchant can create voids that eventually degrade the performance of the oxide layer. Exposing the surface to a liquid solution or gaseous precursor containing silane seals the defects without causing an overall thickness change. The silane reacts at sites with silanol (or other hydrogen) bonds, breaking the bonds and replacing the hydrogen with silicon, but does not react in the absence of a hydrogen bond.
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