发明申请
- 专利标题： SYSTEMS AND METHODS FOR SAMPLE ANALYSIS
- 专利标题（中）： 用于样本分析的系统和方法
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申请号： US14566838申请日： 2014-12-11
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公开(公告)号： US20150102218A1公开(公告)日： 2015-04-16
- 发明人: Robert Graham Cooks , Guangtao Li , Xin Li , Zheng Ouyang
- 申请人： Purdue Research Foundation
- 主分类号： H01J49/04
- IPC分类号： H01J49/04 ; H01J49/06 ; H01J49/00
摘要：
The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.
公开/授权文献
- US09165752B2 Systems and methods for sample analysis 公开/授权日：2015-10-20
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