发明申请
US20150122419A1 LASER AND PLASMA ETCH WAFER DICING WITH A DOUBLE SIDED UV-CURABLE ADHESIVE FILM
审中-公开
激光和等离子切割带双面紫外线固化胶片
- 专利标题: LASER AND PLASMA ETCH WAFER DICING WITH A DOUBLE SIDED UV-CURABLE ADHESIVE FILM
- 专利标题(中): 激光和等离子切割带双面紫外线固化胶片
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申请号: US14595120申请日: 2015-01-12
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公开(公告)号: US20150122419A1公开(公告)日: 2015-05-07
- 发明人: Mohammad Kamruzzaman Chowdhury , Wei-Sheng Lei , Todd Egan , Brad Eaton , Madhava Rao Yalamanchili , Ajay Kumar
- 申请人: Mohammad Kamruzzaman Chowdhury , Wei-Sheng Lei , Todd Egan , Brad Eaton , Madhava Rao Yalamanchili , Ajay Kumar
- 主分类号: H01L21/67
- IPC分类号: H01L21/67 ; B23K26/36 ; B23K26/40 ; H01L21/683
摘要:
Laser and plasma etch wafer dicing using UV-curable adhesive films. A mask is formed covering ICs formed on the wafer, as well as any bumps providing an interface to the ICs. The semiconductor wafer is coupled to a carrier substrate by a double-sided UV-curable adhesive film. The mask is patterned by laser scribing to provide a patterned mask with gaps. The patterning exposes regions of the semiconductor wafer, below thin film layers from which the ICs are formed. The semiconductor wafer is then etched through the gaps in the patterned mask to singulate the ICs. The UV-curable adhesive film is partially cured by UV irradiation through the carrier. The singulated ICs are then detached from the partially cured adhesive film still attached to the carrier substrate, for example individually by a pick and place machine. The UV-curable adhesive film may then be further cured for the film's complete removal from the carrier substrate.
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