Invention Application
US20150214979A1 Cyclic Redundancy Check Circuit And Semiconductor Device Having The Cyclic Redundancy Check Circuit
有权
循环冗余校验电路和具有循环冗余校验电路的半导体器件
- Patent Title: Cyclic Redundancy Check Circuit And Semiconductor Device Having The Cyclic Redundancy Check Circuit
- Patent Title (中): 循环冗余校验电路和具有循环冗余校验电路的半导体器件
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Application No.: US14679148Application Date: 2015-04-06
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Publication No.: US20150214979A1Publication Date: 2015-07-30
- Inventor: Masafumi ITO , Tomoaki ATSUMI
- Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Priority: JP2005-273356 20050921
- Main IPC: H03M13/09
- IPC: H03M13/09
Abstract:
An object of the present invention is to provide a CRC circuit with more simple structure and low power consumption. The CRC circuit includes a first shift register to a p-th shift register, a first EXOR to a (p−1)th EXOR, and a switching circuit. A data signal, a select signal, and an output of a last stage of the p-th shift register are inputted to the switching circuit, and the switching circuit switches a first signal or a second signal in response to the select signal to be outputted.
Public/Granted literature
- US09294126B2 Cyclic redundancy check circuit and semiconductor device having the cyclic redundancy check circuit Public/Granted day:2016-03-22
Information query
IPC分类:
