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1.发明申请Cyclic Redundancy Check Circuit And Semiconductor Device Having The Cyclic Redundancy Check Circuit 有权循环冗余校验电路和具有循环冗余校验电路的半导体器件公开(公告)号：US20140120858A1
公开(公告)日：2014-05-01
申请号：US14147652
申请日：2014-01-06
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor： Masafumi ITO , Tomoaki Atsumi
Abstract: An object of the present invention is to provide a CRC circuit with more simple structure and low power consumption. The CRC circuit includes a first shift register to a p-th shift register, a first EXOR to a (p−1)th EXOR, and a switching circuit. A data signal, a select signal, and an output of a last stage of the p-th shift register are inputted to the switching circuit, and the switching circuit switches a first signal or a second signal in response to the select signal to be outputted.
Abstract translation: 本发明的目的是提供一种具有更简单的结构和低功耗的CRC电路。 CRC电路包括到第p移位寄存器的第一移位寄存器，第一EXOR到第（p-1）个EXOR和开关电路。 数据信号，选择信号和第p移位寄存器的最后级的输出被输入到开关电路，并且开关电路响应于要输出的选择信号而切换第一信号或第二信号 。
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2.发明申请Cyclic Redundancy Check Circuit And Semiconductor Device Having The Cyclic Redundancy Check Circuit 有权循环冗余校验电路和具有循环冗余校验电路的半导体器件公开(公告)号：US20150214979A1
公开(公告)日：2015-07-30
申请号：US14679148
申请日：2015-04-06
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor： Masafumi ITO , Tomoaki ATSUMI
IPC: H03M13/09
Abstract: An object of the present invention is to provide a CRC circuit with more simple structure and low power consumption. The CRC circuit includes a first shift register to a p-th shift register, a first EXOR to a (p−1)th EXOR, and a switching circuit. A data signal, a select signal, and an output of a last stage of the p-th shift register are inputted to the switching circuit, and the switching circuit switches a first signal or a second signal in response to the select signal to be outputted.
Abstract translation: 本发明的目的是提供一种具有更简单的结构和低功耗的CRC电路。 CRC电路包括到第p移位寄存器的第一移位寄存器，第一EXOR到第（p-1）个EXOR和开关电路。 数据信号，选择信号和第p移位寄存器的最后级的输出被输入到开关电路，并且开关电路响应于要输出的选择信号而切换第一信号或第二信号 。
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