Invention Application
- Patent Title: FLUORINE FREE TUNGSTEN ALD/CVD PROCESS
- Patent Title (中): 无氟化学气相沉积/ CVD工艺
-
Application No.: US14431116Application Date: 2013-09-26
-
Publication No.: US20150251920A1Publication Date: 2015-09-10
- Inventor: Weimin Li , David W. Peters , Scott L. Battle , William Hunks
- Applicant: ENTEGRIS, INC.
- Applicant Address: US MA Billerica
- Assignee: ENTEGRIS, INC.
- Current Assignee: ENTEGRIS, INC.
- Current Assignee Address: US MA Billerica
- International Application: PCT/US13/61996 WO 20130926
- Main IPC: C01G41/00
- IPC: C01G41/00 ; C07F11/00 ; H01B1/02 ; C09D5/24 ; C23C16/16 ; C01C3/11

Abstract:
A tungsten precursor useful for forming tungsten-containing material on a substrate, e.g., in the manufacture of microelectronic devices. The tungsten precursor is devoid of fluorine content, and may be utilized in a solid delivery process or other vapor deposition technique, to form films such as elemental tungsten for metallization of integrated circuits, or tungsten nitride films or other tungsten compound films that are useful as base layers for subsequent elemental tungsten metallization.
Public/Granted literature
- US09637395B2 Fluorine free tungsten ALD/CVD process Public/Granted day:2017-05-02
Information query
IPC分类: