Invention Application
- Patent Title: SPECTROSCOPIC MEASUREMENT DEVICE
- Patent Title (中): 光谱测量装置
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Application No.: US14431573Application Date: 2013-09-25
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Publication No.: US20150260573A1Publication Date: 2015-09-17
- Inventor: Ichiro Ishimaru
- Applicant: NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY
- Applicant Address: JP Takamatsu-shi, Kagawa
- Assignee: NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY
- Current Assignee: NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY
- Current Assignee Address: JP Takamatsu-shi, Kagawa
- Priority: JP2012-219760 20121001
- International Application: PCT/JP2013/075904 WO 20130925
- Main IPC: G01J3/26
- IPC: G01J3/26 ; A61B5/00 ; A61B5/1455 ; A61B5/145 ; G01J3/45 ; G01J3/02

Abstract:
A spectroscopic measurement device includes a dark filter that is arranged on an optical path between an imaging optical system and a light detection unit and includes a plurality of regions having different transmittances, the filter being configured such that a fixed reflected measurement light and a movable reflected measurement light that are guided to a same point by the imaging optical system and form interference light are transmitted through a same region; and an arithmetic processing unit that obtains an interferogram of the measurement light at a transmittance corresponding to each of two or more regions from a detection signal of each pixel of a light detection unit when a movable reflection unit is moved, and obtains a spectrum of the measurement light based on the interferogram.
Public/Granted literature
- US09513165B2 Spectroscopic measurement device Public/Granted day:2016-12-06
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