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    Spectrometry device
    1.
    发明授权
    Spectrometry device 有权

    公开(公告)号：US12235157B2

    公开(公告)日：2025-02-25

    申请号：US17640225

    申请日：2020-08-28

    Applicant: NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY

    Inventor： Ichiro Ishimaru

    IPC: G01J3/02 ,  G01J3/453

    Abstract: A spectrometry device wherein light rays emitted from an object face measurement point combine into one parallel light beam by an objective lens, this is divided into a first and second light beam by a phase shifter, and the first and second light beam emit toward a light-receiving face of a photodetector while providing an optical path length difference. A light-shielding plate is arranged on a face optically conjugate the object face respective to the objective lens, and only light passed through translucent portions of the light-shielding plate is directed to the objective lens. A lateral length of each light-shielding plate translucent portion and the interval between two adjacent translucent portions are based on the objective lens focal length, the distance from the phase shifter to the photodetector light-receiving face, a photodetector pixel pitch, a pixel length, and a predetermined wavelength range of the light emitted from the measurement point.

    Optical measuring apparatus and optical measuring method
    2.
    发明授权
    Optical measuring apparatus and optical measuring method 有权

    公开(公告)号：US11231272B2

    公开(公告)日：2022-01-25

    申请号：US16764526

    申请日：2018-10-30

    Applicant: NEC CORPORATION ,  NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY

    Inventor： Takeshi Akagawa ,  Masahiro Kubo ,  Katsumi Abe ,  Ersin Altintas ,  Yuji Ohno ,  Tetsuri Ariyama ,  Ichiro Ishimaru

    IPC: G01B9/02 ,  G01J3/45

    Abstract: Optical measuring apparatus includes: a light source irradiating an object to be measured; a splitter splitting transmitted light or reflected light from the object to be measured; a phase changer changing a phase of a first light which is one of the lights split; a phase fixer maintaining a phase of a second light which is the other light split; a multiplexer multiplexing lights output from the phase changer and the phase fixer; a detector detecting the light (interference image) output from the multiplexer; and a controller that extracts a reference point from the interference image, when a displacement of the reference point is detected, corrects a luminance value for each pixel of the interference images in accordance with a displacement of the object to be measured indicated by a displacement of the reference point, constructs an interferogram based on the luminance value for each pixel of the interference images after the correction.

    Reflected light detecting device and reflected light detecting method
    3.
    发明授权
    Reflected light detecting device and reflected light detecting method 有权

    公开(公告)号：US10386236B2

    公开(公告)日：2019-08-20

    申请号：US15597544

    申请日：2017-05-17

    Applicant: NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY

    Inventor： Hiroki Hayashi ,  Ichiro Ishimaru

    IPC: G01B9/02 ,  G01J3/447 ,  G01J3/02 ,  G01J3/45 ,  G01J3/50 ,  G01N21/21 ,  G01N21/25 ,  G01N21/55

    Abstract: Reflected light detecting device and method with surface reflected light components collectively be extracted/removed when detecting reflected light arising in casting light onto target-object range having non-planar surface. The device includes: a first illuminating device causing first-measurement light in predetermined polarization direction to enter target-object first region from first direction; polarization optical system position part of first-surface reflected light enters the polarization optical system, the first-surface reflected light being the first-measurement in the first region surface; a second illuminating device causing second-measurement light in the same first-measurement light polarization direction to enter second region from second direction, the second region being on the target-object surface, different from the first region; adjusting direction of the second-measurement light optical axis so part of second-surface reflected light enters the polarization optical system, the second-surface reflected light being the second-measurement in second region surface; and detecting light having passed through the polarization optical system.

    SPECTROSCOPIC MEASUREMENT DEVICE
    4.
    发明申请
    SPECTROSCOPIC MEASUREMENT DEVICE 有权
    光谱测量装置

    公开(公告)号：US20150268097A1

    公开(公告)日：2015-09-24

    申请号：US14430658

    申请日：2013-10-02

    Applicant: NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY

    Inventor： Ichiro Ishimaru

    IPC: G01J3/45 ,  G01J3/02

    CPC classification number: G01J3/45 ,  G01J3/0208 ,  G01J3/0237 ,  G01J3/0256 ,  G01J3/0291 ,  G01J3/2803 ,  G01J3/4531 ,  G01J3/4532 ,  G01N2021/3595

    Abstract: A spectroscopic measurement device includes: a dividing optical system for dividing a measurement beam emitted from each of a plurality of measurement points located within a measurement area of an object to be measured, into a first measurement beam and a second measurement beam; an imaging optical system; an optical path length difference providing means; a detector including a plurality of pixels; a processor for acquiring an interferogram of a measurement point of the object to be measured; a conjugate plane imaging optical system located between the object to be measured and the dividing optical system; and a periodicity providing means located on the conjugate plane.

    Abstract translation: 光谱测量装置包括：分割光学系统，用于将位于待测物体的测量区域内的多个测量点中的每一个发射的测量光束分成第一测量光束和第二测量光束; 成像光学系统; 光路长度差提供装置; 检测器，其包括多个像素; 用于获取待测量对象的测量点的干涉图的处理器; 位于待测物体与分光光学系统之间的共轭平面成像光学系统; 以及位于共轭平面上的周期性提供装置。

    SPECTROSCOPIC MEASUREMENT DEVICE
    5.
    发明申请
    SPECTROSCOPIC MEASUREMENT DEVICE 有权
    光谱测量装置

    公开(公告)号：US20150260573A1

    公开(公告)日：2015-09-17

    申请号：US14431573

    申请日：2013-09-25

    Applicant: NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY

    Inventor： Ichiro Ishimaru

    IPC: G01J3/26 ,  A61B5/00 ,  A61B5/1455 ,  A61B5/145 ,  G01J3/45 ,  G01J3/02

    CPC classification number: G01J3/26 ,  A61B5/14532 ,  A61B5/14546 ,  A61B5/1455 ,  A61B5/7257 ,  A61B2562/0238 ,  F04C2270/0421 ,  G01J3/0205 ,  G01J3/0213 ,  G01J3/45 ,  G01J3/4532 ,  G01J3/4535 ,  G01J2003/1213 ,  G01N21/359 ,  G01N21/4738 ,  G01N21/49 ,  G01N2021/3595

    Abstract: A spectroscopic measurement device includes a dark filter that is arranged on an optical path between an imaging optical system and a light detection unit and includes a plurality of regions having different transmittances, the filter being configured such that a fixed reflected measurement light and a movable reflected measurement light that are guided to a same point by the imaging optical system and form interference light are transmitted through a same region; and an arithmetic processing unit that obtains an interferogram of the measurement light at a transmittance corresponding to each of two or more regions from a detection signal of each pixel of a light detection unit when a movable reflection unit is moved, and obtains a spectrum of the measurement light based on the interferogram.

    Abstract translation: 光谱测量装置包括配置在成像光学系统和光检测单元之间的光路上的暗滤波器，并且包括具有不同透射率的多个区域，所述滤光器被配置为使得固定的反射测量光和可移动的反射 通过成像光学系统被引导到同一点并形成干涉光的测量光通过相同的区域传输; 以及算术处理单元，当可移动反射单元移动时，从光检测单元的每个像素的检测信号中获得与两个或更多个区域中的每一个相对应的透射率的测量光的干涉图，并获得 基于干涉图的测量光。

    Spectral measurement device and spectral measurement method
    9.
    发明授权
    Spectral measurement device and spectral measurement method 有权

    公开(公告)号：US12102430B2

    公开(公告)日：2024-10-01

    申请号：US18285763

    申请日：2022-03-30

    Applicant: NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY

    Inventor： Ichiro Ishimaru

    IPC: A61B5/1455 ,  A61B5/145

    CPC classification number: A61B5/1455 ,  A61B5/14532

    Abstract: A spectral measurement device to detect measurement light including light emitted from a measurement object and to measure spectral characteristic of the light, including: a spectral optical system to disperse the measurement light; a detection unit to detect intensity of light dispersed by the spectral optical system; a spectral characteristic acquisition unit to acquire a measurement light spectral characteristic indicating a relationship between a light intensity and a wavelength of the measurement light on a basis of a detection result; a storage unit to store spectral characteristic information on possible background light, the information indicating a spectral characteristic of the possible background light, which involves a spectral sensitivity characteristic of the detection unit; and a processing unit to obtain a spectral characteristic of background light emitted from the ambience of the measurement object, from the measurement light spectral characteristic and the spectral characteristic information on the possible background light.

    Optical characteristic measuring device and optical characteristic measuring method
    10.
    发明授权
    Optical characteristic measuring device and optical characteristic measuring method 有权

    公开(公告)号：US11035782B2

    公开(公告)日：2021-06-15

    申请号：US16326006

    申请日：2017-08-18

    Applicant: NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY

    Inventor： Ichiro Ishimaru

    IPC: G01B9/02 ,  G01N21/27 ,  G01N21/17

    Abstract: A light source, a standing wave forming unit, a detector, and an absorbance calculating unit. The light source irradiates a sample with light. The standing wave forming unit forms, in the sample, an acoustic standing wave perpendicular to a surface of the sample. A node of the acoustic standing wave is positioned at a predetermined distance from the surface of the sample, the light from the light source entering the surface of the sample. The detector detects light emitted from the surface of the sample, and is disposed on the surface of the sample on a side where the light source is disposed. The absorbance calculating unit obtains absorbance.

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