Invention Application
- Patent Title: VOLTAGE DETECTION CIRCUIT
- Patent Title (中): 电压检测电路
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Application No.: US14656163Application Date: 2015-03-12
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Publication No.: US20150260802A1Publication Date: 2015-09-17
- Inventor: Makoto MITANI , Kotaro WATANABE
- Applicant: SEIKO INSTRUMENTS INC.
- Priority: JP2014-050434 20140313
- Main IPC: G01R31/40
- IPC: G01R31/40 ; G01R19/155

Abstract:
To provide a voltage detection circuit in which the influence on a detection voltage by semiconductor manufacturing variations is small and which is small in current consumption. A voltage detection circuit is provided which detects a voltage, based on an output signal of a detection circuit and outputs a detection signal. The detection circuit includes a first MOS transistor unit which allows a first current to flow, a second MOS transistor unit which allows a second current to flow, and a current voltage conversion unit which converts each of the first current and the second current into a voltage and outputs the same as the detection signal. A voltage characteristic of the first current and a voltage characteristic of the second current are configured so as to be crossed with each other at a predetermined voltage.
Public/Granted literature
- US09933494B2 Voltage detection circuit Public/Granted day:2018-04-03
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