Invention Application
US20150301202A1 X-RAY ENERGY SPECTRUM MEASUREMENT METHOD, X-RAY ENERGY SPECTRUM MEASUREMENT APPARATUS, AND X-RAY CT APPARATUS
有权
X射线能量光谱测量方法,X射线能量谱测量装置和X射线CT装置
- Patent Title: X-RAY ENERGY SPECTRUM MEASUREMENT METHOD, X-RAY ENERGY SPECTRUM MEASUREMENT APPARATUS, AND X-RAY CT APPARATUS
- Patent Title (中): X射线能量光谱测量方法,X射线能量谱测量装置和X射线CT装置
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Application No.: US14687948Application Date: 2015-04-16
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Publication No.: US20150301202A1Publication Date: 2015-10-22
- Inventor: Hiroyuki TAKAGI , Isao MURATA
- Applicant: Hitachi, Ltd.
- Priority: JP2014-086712 20140418
- Main IPC: G01T1/36
- IPC: G01T1/36 ; G01N23/04

Abstract:
Provided is an X-ray energy spectrum estimation method capable of reproducing, with high precision, information on an attenuation path to which an X-ray is irradiated, and performing, with high precision, reconstruction of an X-ray CT image by enabling high-precision estimation of spectrum of energy released from an X-ray source device. An energy spectrum estimation device (92) normalizes a response function, and calculates a modified efficiency matrix from the normalized response function, a detection efficiency matrix, and a measurement-system correction coefficient. The energy spectrum estimation device then calculates a particular result in accordance with a Bayesian estimation equation, without divergence, with use of the calculated modified efficiency matrix, the normalized modified efficiency matrix, and an attenuation characteristic curve obtained by a measurement circuit (30). The energy spectrum (92) calculates an X-ray energy spectrum by dividing, by the normalized modified efficiency matrix, the particular result obtained by the Bayesian estimation equation.
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