Invention Application
US20150323872A1 Projection System and Mirror and Radiation Source for a Lithographic Apparatus
审中-公开
投影系统和平版印刷设备的镜面和辐射源
- Patent Title: Projection System and Mirror and Radiation Source for a Lithographic Apparatus
- Patent Title (中): 投影系统和平版印刷设备的镜面和辐射源
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Application No.: US14762190Application Date: 2013-12-12
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Publication No.: US20150323872A1Publication Date: 2015-11-12
- Inventor: Marcus Adrianus VAN DE KERKHOF , Anton Bernhard VAN OOSTEN , Hans BUTLER , Erik Roelof LOOPSTRA , Marc Wilhelmus Maria VAN DER WIJST , Koen Jacobus Johannes Maria ZAAL
- Applicant: ASML NETHERLANDS B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- International Application: PCT/EP2013/076310 WO 20131212
- Main IPC: G03F7/20
- IPC: G03F7/20 ; G02B7/182

Abstract:
Disclosed is a system configured to project a beam of radiation onto a target portion of a substrate within a lithographic apparatus. The system comprises a mirror (510) having an actuator (500) for positioning the mirror and/or configuring the shape of the mirror, the actuator also providing active damping to the mirror, and a controller (515a, 515b) for generating actuator control signals for control of said actuator(s). A first coordinate system is used for control of said actuator(s) when positioning said mirror and/or configuring the shape of said mirror and a second coordinate system is used for control of said actuator(s) when providing active damping to said mirror.
Public/Granted literature
- US10216093B2 Projection system and minor and radiation source for a lithographic apparatus Public/Granted day:2019-02-26
Information query
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