Invention Application
- Patent Title: REPAIR CIRCUIT AND FUSE CIRCUIT
- Patent Title (中): 维修电路和保险丝电路
-
Application No.: US14595500Application Date: 2015-01-13
-
Publication No.: US20150325316A1Publication Date: 2015-11-12
- Inventor: Kyu-Chang KANG , Gil-Su KIM , Je-Min RYU , Yun-Young LEE , Kyo-Min SOHN
- Applicant: Samsung Electronics Co., Ltd.
- Priority: KR10-2014-0056355 20140512
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C17/18 ; G11C17/16

Abstract:
A repair circuit includes first and second fuse circuits, a determination circuit and an output circuit. The first fuse circuit includes a first fuse and is configured to generate a first master signal indicating whether the first fuse has been programmed. The second fuse circuit includes second fuses and is configured to generate a first address indicating whether each of the second fuses has been programmed. The determination circuit is configured to generate a detection signal based on the first master signal and the first address. The detection signal indicates whether a negative program operation has been performed on the second fuse circuit. The output circuit is configured to generate a second master signal based on the first master signal and the detection signal and generate a repair address corresponding to a defective input address based on the first address and the detection signal.
Public/Granted literature
- US09287009B2 Repair circuit and fuse circuit Public/Granted day:2016-03-15
Information query