- 专利标题: SELECTIVE FORMATION OF METALLIC FILMS ON METALLIC SURFACES
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申请号: US14737293申请日: 2015-06-11
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公开(公告)号: US20160005649A1公开(公告)日: 2016-01-07
- 发明人: Suvi P. Haukka , Antti Niskanen , Marko Tuominen
- 申请人: ASM International N.V.
- 主分类号: H01L21/768
- IPC分类号: H01L21/768
摘要:
Metallic layers can be selectively deposited on one surface of a substrate relative to a second surface of the substrate. In some embodiments, the metallic layers are selectively deposited on copper instead of insulating or dielectric materials. In some embodiments, a first precursor forms a layer on the first surface and is subsequently reacted or converted to form a metallic layer. The deposition temperature may be selected such that a selectivity of above about 50% or even about 90% is achieved.
公开/授权文献
- US09502289B2 Selective formation of metallic films on metallic surfaces 公开/授权日:2016-11-22
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