A test fixture generally includes a thermoelectric cooler (TEC) configured to regulate the temperature of a device under test (DUT). The test fixture may further include a device carrier configured to secure the DUT in a desired position relative to the TEC and a spring-operated pin configured to generate a desired contact pressure between the DUT and the TEC. The desired contact pressure may be selected to achieve a thermal coupling between the DUT and the TEC that maintains the temperature of the DUT at a desired operation level.