公开(公告)号：US09606145B2

公开(公告)日：2017-03-28

申请号：US14452715

申请日：2014-08-06

Applicant: Applied Optoelectronics, Inc.

Inventor： Luohan Peng ,  Darren Tucker ,  Justin Lii ,  David Hendricks

IPC: G01R1/44 ,  G01R1/067

CPC classification number: G01R1/44 ,  G01R1/06722 ,  G01R31/2635 ,  G01R31/2863 ,  G01R31/2877

Abstract: A test fixture generally includes a thermoelectric cooler (TEC) configured to regulate the temperature of a device under test (DUT). The test fixture may further include a device carrier configured to secure the DUT in a desired position relative to the TEC and a spring-operated pin configured to generate a desired contact pressure between the DUT and the TEC. The desired contact pressure may be selected to achieve a thermal coupling between the DUT and the TEC that maintains the temperature of the DUT at a desired operation level.

公开(公告)号：US20160041202A1

公开(公告)日：2016-02-11

申请号：US14452715

申请日：2014-08-06

Applicant: Applied Optoelectronics, Inc.

Inventor： Luohan Peng ,  Darren Tucker ,  Justin Lii ,  David Hendricks

IPC: G01R1/44 ,  G01R1/067

CPC classification number: G01R1/44 ,  G01R1/06722 ,  G01R31/2635 ,  G01R31/2863 ,  G01R31/2877

Abstract: A test fixture generally includes a thermoelectric cooler (TEC) configured to regulate the temperature of a device under test (DUT). The test fixture may further include a device carrier configured to secure the DUT in a desired position relative to the TEC and a spring-operated pin configured to generate a desired contact pressure between the DUT and the TEC. The desired contact pressure may be selected to achieve a thermal coupling between the DUT and the TEC that maintains the temperature of the DUT at a desired operation level.

Abstract translation: 测试夹具通常包括被配置为调节被测器件（DUT）的温度的热电冷却器（TEC）。 测试夹具还可以包括被配置为将DUT固定在相对于TEC的期望位置的设备载体，以及被配置为在DUT和TEC之间产生期望的接触压力的弹簧操作的引脚。 可以选择期望的接触压力以实现DUT和TEC之间的热耦合，其将DUT的温度保持在期望的操作水平。