Invention Application
- Patent Title: SEMICONDUCTOR PHOTO-DETECTING DEVICE
- Patent Title (中): 半导体光电检测器件
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Application No.: US14922946Application Date: 2015-10-26
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Publication No.: US20160043263A1Publication Date: 2016-02-11
- Inventor: Ki Yon PARK , Hwa Mok KIM , Kyu Ho LEE , Sung Hyun LEE , Hyung Kyu KIM
- Applicant: Seoul Viosys Co., Ltd.
- Priority: KR10-2013-0113854 20130925
- Main IPC: H01L31/108
- IPC: H01L31/108 ; H01L31/0232 ; H01L31/0304

Abstract:
A photo-detecting device includes a first nitride layer, a light absorption layer disposed on the first nitride layer, and a Schottky junction layer disposed on the light absorption layer. According to a photoluminescence (PL) properties measurement of the photo-detecting device, a first peak light intensity is greater than a second peak light intensity, and the first peak light intensity is a peak light intensity of light emitted from the light absorption layer, and the second peak light intensity is a peak light intensity of light emitted from the first nitride layer.
Public/Granted literature
- US09478690B2 Semiconductor photo-detecting device Public/Granted day:2016-10-25
Information query
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