An apparatus and method for facilitating testing of an electronic device is provided. The apparatus includes a strike plate with an integrated socket. Alignment dowels are located on an outside rim of the integrated strike plate and socket. Shims are located in a recess in the outside rim of the integrated strike plate and socket and may be used to adjust the height of the assembly to facilitate handling by an automated test handler. The apparatus further includes a memory nest assembly having a receptacle for retaining an electronic device to be tested. In addition, the memory nest assembly is formed to mate with the socket on the integrated strike plate.