公开(公告)号：US20160084880A1

公开(公告)日：2016-03-24

申请号：US14493265

申请日：2014-09-22

Applicant: QUALCOMM Incorporated

Inventor： Rae-Ann LoCicero ,  Keith Barry ,  Anthony Newman

IPC: G01R1/04 ,  G01R31/28

CPC classification number: G01R1/0466 ,  G01R31/2893

Abstract: An apparatus and method for facilitating testing of an electronic device is provided. The apparatus includes a strike plate with an integrated socket. Alignment dowels are located on an outside rim of the integrated strike plate and socket. Shims are located in a recess in the outside rim of the integrated strike plate and socket and may be used to adjust the height of the assembly to facilitate handling by an automated test handler. The apparatus further includes a memory nest assembly having a receptacle for retaining an electronic device to be tested. In addition, the memory nest assembly is formed to mate with the socket on the integrated strike plate.

Abstract translation: 提供一种便于电子设备测试的设备和方法。 该装置包括具有集成插座的冲击板。 定位销位于集成冲击板和插座的外边缘上。 垫片位于集成打击板和插座的外边缘中的凹部中，并且可以用于调节组件的高度以便于通过自动测试处理器的处理。 该装置还包括具有用于保持要测试的电子设备的插座的存储器嵌套组件。 此外，存储器套组件形成为与集成冲击板上的插座相配合。