Invention Application
- Patent Title: Systems and Methods for Sample Characterization
- Patent Title (中): 样品表征的系统和方法
-
Application No.: US14861925Application Date: 2015-09-22
-
Publication No.: US20160091389A1Publication Date: 2016-03-31
- Inventor: Youxiang Zuo , Vinay K. Mishra , Hadrien Dumont , Adriaan Gisolf , Christopher Babin , Cosan Ayan , Beatriz E. Barbosa
- Applicant: Schlumberger Technology Corporation
- Main IPC: G01M3/32
- IPC: G01M3/32 ; E21B49/08

Abstract:
The present disclosure relates to systems and methods for determining an integrity of a sample chamber. In certain embodiments, formation fluid is collected from a subterranean formation within a sample chamber disposed in a downhole tool, the downhole tool is withdrawn from a wellbore, an estimated surface pressure of the collected formation fluid is determined, the estimated surface pressure of the collected formation fluid is compared with an actual surface pressure of the sample chamber, and the integrity of the sample chamber is determined based on the comparison of the estimated surface pressure and the actual surface pressure.
Public/Granted literature
- US10024755B2 Systems and methods for sample characterization Public/Granted day:2018-07-17
Information query