Invention Application
- Patent Title: Read Retry For Non-Volatile Memories
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Application No.: US14961865Application Date: 2015-12-07
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Publication No.: US20160093396A1Publication Date: 2016-03-31
- Inventor: AbdelHakim S Alhussien , Erich F Haratsch , Sundararajan Sankaranarayanan , YingQuan Wu
- Applicant: Seagate Technology LLC
- Applicant Address: US CA Cupertino
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Cupertino
- Main IPC: G11C16/28
- IPC: G11C16/28 ; G11C29/42 ; G11C16/08 ; G11C16/26 ; G11C29/02

Abstract:
An apparatus for reading a non-volatile memory includes a tracking module operable to calculate means and variances of voltage level distributions in a non-volatile memory and to calculate at least one reference voltage to be used when reading the non-volatile memory based on the means and variances, a likelihood generator operable to calculate at least one other reference voltage to be used when reading the non-volatile memory, wherein the at least one other reference voltage is based at least in part on a predetermined likelihood value constellation, and to map read patterns from the non-volatile memory to likelihood values, and a read controller operable to read the non-volatile memory using the at least one reference voltage and the at least one other reference voltage to yield the read patterns.
Public/Granted literature
- US09548128B2 Read retry for non-volatile memories Public/Granted day:2017-01-17
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