Invention Application
US20160116527A1 STOCHASTIC AND TOPOLOGICALLY AWARE ELECTROMIGRATION ANALYSIS METHODOLOGY
审中-公开
STOCHASTIC和拓扑学电磁分析方法学
- Patent Title: STOCHASTIC AND TOPOLOGICALLY AWARE ELECTROMIGRATION ANALYSIS METHODOLOGY
- Patent Title (中): STOCHASTIC和拓扑学电磁分析方法学
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Application No.: US14865339Application Date: 2015-09-25
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Publication No.: US20160116527A1Publication Date: 2016-04-28
- Inventor: Palkesh Jain
- Applicant: QUALCOMM Incorporated
- Priority: IN5338/CHE/2014 20141027
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/12 ; G01R31/26
Abstract:
A computer-implemented method for analyzing a system comprising a plurality of components is described herein according to certain aspects. The method comprises simulating the system cascading through a plurality of failures until the system fails to meet a system specification, each of the failures corresponding to a failure of one of the components. The method also comprises estimating a time to failure of the system based on a last one of the plurality of failures.
Information query
