Invention Application
US20160163388A1 APPLYING SUBSTANTIALLY THE SAME VOLTAGE DIFFERENCES ACROSS MEMORY CELLS AT DIFFERENT LOCATIONS ALONG AN ACCESS LINE WHILE PROGRAMMING 有权
在编程时可以在不同位置处应用大量不同位置的电压差异

  • Patent Title: APPLYING SUBSTANTIALLY THE SAME VOLTAGE DIFFERENCES ACROSS MEMORY CELLS AT DIFFERENT LOCATIONS ALONG AN ACCESS LINE WHILE PROGRAMMING
  • Patent Title (中): 在编程时可以在不同位置处应用大量不同位置的电压差异
  • Application No.: US14558900
    Application Date: 2014-12-03
  • Publication No.: US20160163388A1
    Publication Date: 2016-06-09
  • Inventor: Feng PanRamin Ghodsi
  • Applicant: MICRON TECHNOLOGY, INC.
  • Applicant Address: US ID Boise
  • Assignee: MICRON TECHNOLOGY, INC.
  • Current Assignee: MICRON TECHNOLOGY, INC.
  • Current Assignee Address: US ID Boise
  • Main IPC: G11C16/10
  • IPC: G11C16/10
APPLYING SUBSTANTIALLY THE SAME VOLTAGE DIFFERENCES ACROSS MEMORY CELLS AT DIFFERENT LOCATIONS ALONG AN ACCESS LINE WHILE PROGRAMMING
Abstract:
An embodiment of a method of programing might include applying a first voltage difference across a first memory cell to be programed, where applying the first voltage difference comprises applying a first channel bias voltage to a channel of the first memory cell, and applying a second voltage difference, substantially equal to the first voltage difference, across a second memory cell to be programed while applying the first voltage difference across the first memory-cell, where applying the second voltage difference comprises applying a second channel bias voltage to a channel of the second memory cell. The first channel bias voltage is different than the second channel bias voltage, and the first memory cell and the second memory cell are commonly coupled to an access line and are at different locations along a length of the access line.
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