Invention Application
- Patent Title: METHOD FOR FORMING SEMICONDUCTOR DEVICE
- Patent Title (中): 形成半导体器件的方法
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Application No.: US14607085Application Date: 2015-01-28
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Publication No.: US20160190287A1Publication Date: 2016-06-30
- Inventor: Chih-Kai Hsu , Chao-Hung Lin , Yu-Hsiang Hung , Ssu-I Fu , Ying-Tsung Chen , Shih-Hung Tsai , Jyh-Shyang Jenq
- Applicant: UNITED MICROELECTRONICS CORP.
- Priority: CN201410848409.9 20141231
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L21/306 ; H01L21/3105

Abstract:
A method of forming a semiconductor device includes following steps. Firstly, a substrate having a transistor is provided, where the transistor includes a source/drain region. A dielectric layer is formed on the substrate, and a contact plug is formed in the dielectric layer to electrically connect the source/drain region. Next, a mask layer is formed on the dielectric layer, where the mask layer includes a first layer and a second layer stacked thereon. After this a slot-cut pattern is formed on the second layer of the mask layer, and a contact slot pattern is formed on the first layer of the mask layer. Finally, the second layer is removed and a contact opening is formed by using the contact slot pattern on the first layer.
Public/Granted literature
- US09755056B2 Method for forming semiconductor device Public/Granted day:2017-09-05
Information query
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