Invention Application
- Patent Title: METHOD AND APPARATUS FOR MONITORING A POLISHING SURFACE OF A POLISHING PAD USED IN POLISHING APPARATUS
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Application No.: US15051928Application Date: 2016-02-24
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Publication No.: US20160207162A1Publication Date: 2016-07-21
- Inventor: Hiroyuki SHINOZAKI , Takahiro SHIMANO , Akira IMAMURA , Akira NAKAMURA
- Applicant: EBARA CORPORATION
- Priority: JP2011-124057 20110602
- Main IPC: B24B37/005
- IPC: B24B37/005

Abstract:
A method is capable of monitoring the polishing surface of the polishing pad without removing the polishing pad from the polishing table. The method includes: conditioning the polishing surface of the polishing pad by causing a rotating dresser to oscillate on the polishing surface; measuring a height of the polishing surface when the conditioning of the polishing surface is performed; calculating a position of a measuring point of the height on a two-dimensional surface defined on the polishing surface; and repeating the measuring of the height of the polishing surface and the calculating of the position of the measuring point to create height distribution in the polishing surface.
Public/Granted literature
- US09943943B2 Method and apparatus for monitoring a polishing surface of a polishing pad used in polishing apparatus Public/Granted day:2018-04-17
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