Aspects of the present disclosure are directed to methods, apparatuses and systems involving a switched probe contact. According to an example embodiment, an apparatus includes logic circuitry, a first circuit to communicate signals with the logic circuitry, and a first bond pad connected to the first circuit via a first circuit path. The apparatus also includes a second circuit to communicate signals with the logic circuitry, and a second bond pad connected to the second circuit via a second circuit path. A probe contact is connected to the first bond pad and communicates signals with an external probe, and a switch circuit is connected to the probe contact and the second circuit path. The switch circuit communicates signals between the probe contact and the second circuit path by selectively connecting and disconnecting the probe contact to the second circuit path.