Invention Application
US20160299009A1 APPARATUS AND METHOD FOR MEASURING TEMPERATURE IN ELECTRONIC DEVICE
审中-公开
用于测量电子设备温度的装置和方法
- Patent Title: APPARATUS AND METHOD FOR MEASURING TEMPERATURE IN ELECTRONIC DEVICE
- Patent Title (中): 用于测量电子设备温度的装置和方法
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Application No.: US15092057Application Date: 2016-04-06
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Publication No.: US20160299009A1Publication Date: 2016-10-13
- Inventor: Tae-Han JEON , Hongsig KIM , Hyungrock JUNG , Kyungseok KIM , Jungkeun PARK , Taegun PARK , Cheolho CHEONG
- Applicant: Samsung Electronics Co., Ltd.
- Priority: KR10-2015-0051955 20150413
- Main IPC: G01J5/10
- IPC: G01J5/10 ; G01K13/00
Abstract:
An apparatus and method for measuring a temperature in an electronic device. An amount of light of an optical signal reflected off of an object is measured, and a size of a temperature measurement expectation area on the object based is determined based on the measured amount of light. A temperature measurement guide message is output based on a result of comparing the determined size and a reference area.
Public/Granted literature
- US10371577B2 Apparatus and method for measuring temperature in electronic device Public/Granted day:2019-08-06
Information query
