Invention Application
- Patent Title: METHOD FOR DEFECT INDICATION DETECTION
- Patent Title (中): 缺陷指示检测方法
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Application No.: US15100567Application Date: 2014-12-01
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Publication No.: US20160305895A1Publication Date: 2016-10-20
- Inventor: Andrew Frank FERRO , Xingwei YANG , Paulo Ricardo dos Santos MENDONCA , Christopher Allen NAFIS , Patrick Joseph HOWARD
- Applicant: GENERAL ELECTRIC COMPANY
- International Application: PCT/US14/67895 WO 20141201
- Main IPC: G01N23/18
- IPC: G01N23/18 ; G01N23/04
Abstract:
Methods, apparatus and computer-readable media for detecting potential defects in a part are disclosed. A potential defect may be automatically detected in a part, and may be reported to an operator in various ways so that the operator may review the defect and take appropriate action.
Public/Granted literature
- US10203290B2 Method for defect indication detection Public/Granted day:2019-02-12
Information query
