发明申请
- 专利标题: AUTOMATED ANALYZER DEVICE
- 专利标题(中): 自动分析仪器
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申请号: US15109475申请日: 2015-01-05
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公开(公告)号: US20160327587A1公开(公告)日: 2016-11-10
- 发明人: Akihiro YASUI , Yoshihiro SUZUKI , Kazuhiro NAKAMURA , Hitoshi TOKIEDA
- 申请人: HITACHI HIGH-TECHNOLOGIES CORPORATION
- 优先权: JP2014-001070 20140107
- 国际申请: PCT/JP2015/050070 WO 20150105
- 主分类号: G01N35/10
- IPC分类号: G01N35/10
摘要:
In a case where a sample container 15 has a rubber-made lid 35, if a sample nozzle descends and comes into contact with the lid, the sample nozzle is relatively moved inside an arm as far as a lid detection distance, and a detector detects a detection plate. A fact that the sample nozzle comes into contact with the lid is stored together with position information of the sample nozzle, into an operation commanding unit. The sample nozzle further continues to descend, and a suction operation of a sample is performed at a predetermined position. In a case where the sample nozzle collides with a frame portion of the lid and external force is applied thereto, the detector detects that the detection plate is relatively moved as far as the detection distance.
公开/授权文献
- US10302668B2 Automated analyzer device 公开/授权日:2019-05-28
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