Various implementations described herein are directed to a system and methods for generating timing data for an integrated circuit. In one implementation, the method may include generating first timing data for the integrated circuit, and the first timing data may be related to one or more variations of operating conditions for the integrated circuit. Further, the method may include extracting parameter values from the first timing data in association with the one or more variations of operating conditions. Further, the method may include generating second timing data for the integrated circuit, and the second timing data may be based on the extracted parameter values.