公开(公告)号：US20160364517A1

公开(公告)日：2016-12-15

申请号：US14736028

申请日：2015-06-10

Applicant: ARM Limited

Inventor： Jean-Luc Pelloie ,  Kenza Charafeddine

IPC: G06F17/50

CPC classification number: G06F17/5036 ,  G06F17/5031 ,  G06F2217/84

Abstract: Various implementations described herein are directed to a system and methods for generating timing data for an integrated circuit. In one implementation, the method may include generating first timing data for the integrated circuit, and the first timing data may be related to one or more variations of operating conditions for the integrated circuit. Further, the method may include extracting parameter values from the first timing data in association with the one or more variations of operating conditions. Further, the method may include generating second timing data for the integrated circuit, and the second timing data may be based on the extracted parameter values.

Abstract translation: 这里描述的各种实现涉及用于生成集成电路的定时数据的系统和方法。 在一个实现中，该方法可以包括为集成电路产生第一定时数据，并且第一定时数据可以与集成电路的一个或多个操作条件的变化有关。 此外，该方法可以包括与操作条件的一个或多个变化相关联地从第一定时数据提取参数值。 此外，该方法可以包括产生用于集成电路的第二定时数据，并且第二定时数据可以基于所提取的参数值。

公开(公告)号：US09734269B2

公开(公告)日：2017-08-15

申请号：US14736028

申请日：2015-06-10

Applicant: ARM Limited

Inventor： Jean-Luc Pelloie ,  Kenza Charafeddine

IPC: G06F17/50 ,  G06F9/455

CPC classification number: G06F17/5036 ,  G06F17/5031 ,  G06F2217/84

Abstract: Various implementations described herein are directed to a system and methods for generating timing data for an integrated circuit. In one implementation, the method may include generating first timing data for the integrated circuit, and the first timing data may be related to one or more variations of operating conditions for the integrated circuit. Further, the method may include extracting parameter values from the first timing data in association with the one or more variations of operating conditions. Further, the method may include generating second timing data for the integrated circuit, and the second timing data may be based on the extracted parameter values.