Invention Application
- Patent Title: XRF Analyzer for Light Element Detection
- Patent Title (中): 用于光元件检测的XRF分析仪
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Application No.: US15171803Application Date: 2016-06-02
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Publication No.: US20160370307A1Publication Date: 2016-12-22
- Inventor: Richard Creighton , Steven Morris , Shawn Chin , Sanjay Kamtekar
- Applicant: Moxtek, Inc.
- Main IPC: G01N23/223
- IPC: G01N23/223
Abstract:
The invention includes an XRF analyzer with reduced x-ray attenuation between sample and target and between sample and detector. Attenuation can be reduced by removing atmospheric-air paths through which the x-rays must travel. Reduced x-ray attenuation can allow for easier detection of low-atomic-number elements. Cost saving can be achieved by reducing the number of x-ray windows.
Public/Granted literature
- US10175184B2 XRF analyzer for light element detection Public/Granted day:2019-01-08
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