公开(公告)号：US10175184B2

公开(公告)日：2019-01-08

申请号：US15171803

申请日：2016-06-02

Applicant: Moxtek, Inc.

Inventor： Richard Creighton ,  Steven Morris ,  Shawn Chin ,  Sanjay Kamtekar

IPC: G01N23/223 ,  H01J35/24

Abstract: The invention includes an XRF analyzer with reduced x-ray attenuation between sample and target and between sample and detector. Attenuation can be reduced by removing atmospheric-air paths through which the x-rays must travel. Reduced x-ray attenuation can allow for easier detection of low-atomic-number elements. Cost saving can be achieved by reducing the number of x-ray windows.

公开(公告)号：US20160370307A1

公开(公告)日：2016-12-22

申请号：US15171803

申请日：2016-06-02

Applicant: Moxtek, Inc.

Inventor： Richard Creighton ,  Steven Morris ,  Shawn Chin ,  Sanjay Kamtekar

IPC: G01N23/223

CPC classification number: G01N23/223 ,  G01N2223/317 ,  H01J35/24

Abstract: The invention includes an XRF analyzer with reduced x-ray attenuation between sample and target and between sample and detector. Attenuation can be reduced by removing atmospheric-air paths through which the x-rays must travel. Reduced x-ray attenuation can allow for easier detection of low-atomic-number elements. Cost saving can be achieved by reducing the number of x-ray windows.

Abstract translation: 本发明包括XRF分析仪，其在样品和靶之间以及样品和检测器之间具有减小的X射线衰减。 通过去除X射线必须行进的大气 - 空气路径可以减少衰减。 减少的x射线衰减可以更容易地检测低原子数元素。 通过减少X光窗口的数量可以节省成本。