发明申请
- 专利标题: METHOD FOR MANUFACTURING IGBT
- 专利标题(中): 制造IGBT的方法
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申请号: US14902205申请日: 2014-06-13
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公开(公告)号: US20160372570A1公开(公告)日: 2016-12-22
- 发明人: Xuan Huang , Wanli Wang , Genyi Wang
- 申请人: CSMC TECHNOLOGIES FAB1 CO., LTD.
- 优先权: CN201310279389.3 20130703
- 国际申请: PCT/CN2014/079820 WO 20140613
- 主分类号: H01L29/66
- IPC分类号: H01L29/66 ; H01L21/304 ; H01L29/739 ; H01L29/08 ; H01L29/49 ; H01L23/31 ; H01L29/10 ; H01L21/306
摘要:
A method for manufacturing an IGBT, comprising: providing a substrate having a first surface and a second surface and of a first or second type of electrical conductance; forming grooves at intervals on the first surface of the substrate; filling a semiconductor material of the second or first type of electrical conductance into the grooves to form channels, where the type of electrical conductance of the channels is different from the type of electrical conductance of the substrate; bonding on the first surface of the substrate to form a drift region of the second type of electrical conductance; forming a front-side structure of the IGBT on the basis of the drift region; thinning the substrate starting from the second surface of the substrate until the channels are exposed; and forming a rear-side metal electrode on the channels and the thinned substrate. The method has no specific requirement with respect to sheet flow capacity, nor requires a double-sided exposure machine apparatus, is compatible with a conventional process, and has a simple process and high efficiency.
公开/授权文献
- US09553164B2 Method for manufacturing IGBT 公开/授权日:2017-01-24
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