Invention Application
US20170004879A1 1T-1R ARCHITECTURE FOR RESISTIVE RANDOM ACCESS MEMORY 有权
1T-1R电阻随机存取存储器架构

  • Patent Title: 1T-1R ARCHITECTURE FOR RESISTIVE RANDOM ACCESS MEMORY
  • Patent Title (中): 1T-1R电阻随机存取存储器架构
  • Application No.: US15206616
    Application Date: 2016-07-11
  • Publication No.: US20170004879A1
    Publication Date: 2017-01-05
  • Inventor: Deepak Chandra SekarWayne Frederick Ellis
  • Applicant: Rambus Inc.
  • Main IPC: G11C13/00
  • IPC: G11C13/00
1T-1R ARCHITECTURE FOR RESISTIVE RANDOM ACCESS MEMORY
Abstract:
A memory device includes an array of resistive memory cells wherein each pair of resistive memory cells includes a first switching element electrically coupled in series to a first resistive memory element and a second switching element electrically coupled in series to a second resistive memory element. A source of the first switching element and a source of the second switching element receive a common source line signal.
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