Invention Application
US20170016945A1 Apparatus and Method for Generating Signals for ESD Stress Testing an Electronic Device and System for Performing an ESD Stress Test of an Electronic Device
有权
用于产生用于ESD应力的信号的装置和方法测试用于执行电子设备的ESD应力测试的电子设备和系统
- Patent Title: Apparatus and Method for Generating Signals for ESD Stress Testing an Electronic Device and System for Performing an ESD Stress Test of an Electronic Device
- Patent Title (中): 用于产生用于ESD应力的信号的装置和方法测试用于执行电子设备的ESD应力测试的电子设备和系统
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Application No.: US14800535Application Date: 2015-07-15
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Publication No.: US20170016945A1Publication Date: 2017-01-19
- Inventor: Julien Lebon , Yiqun Cao , Ulrich Glaser
- Applicant: Infineon Technologies AG
- Main IPC: G01R31/00
- IPC: G01R31/00
Abstract:
An apparatus and a method for generating signals for ESD stress testing an electronic device are disclosed. In an embodiment the apparatus is configured to receive a source signal including a source pulse, delay the source pulse to generate a test signal including a test pulse with a pulse width in an ESD time range and generate an auxiliary signal including an auxiliary pulse with a pulse width in the ESD time range.
Public/Granted literature
Information query
