Invention Application
US20170019982A1 METHOD, APPARATUS AND SYSTEM FOR PROVIDING MULTIPLE EUV BEAMS FOR SEMICONDUCTOR PROCESSING
审中-公开
用于半导体处理提供多个EUV波段的方法,装置和系统
- Patent Title: METHOD, APPARATUS AND SYSTEM FOR PROVIDING MULTIPLE EUV BEAMS FOR SEMICONDUCTOR PROCESSING
- Patent Title (中): 用于半导体处理提供多个EUV波段的方法,装置和系统
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Application No.: US14803068Application Date: 2015-07-18
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Publication No.: US20170019982A1Publication Date: 2017-01-19
- Inventor: Erik Robert Hosler , Moseh Preil
- Applicant: GLOBALFOUNDRIES Inc.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee Address: KY Grand Cayman
- Main IPC: H05G2/00
- IPC: H05G2/00 ; G21K5/08

Abstract:
At least one method, apparatus and system for providing a plurality of optical beams, such as EUV beams. A first electron beam is received. The first electron beam is converted into at least a second electron beam and a third electron beam. The second and third second and third electron beams to an undulator. Using the undulator for generating a plurality of output beams using the at least second and third electron beams. The output beams respectively comprises a plurality of optical beam components and a plurality of electron beam component. A first optical beam component of the plurality of optical beam components is provided to a first processing tool.
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