Invention Application
- Patent Title: MASS SPECTROMETRY METHOD, MASS SPECTROMETRY , AND MASS SPECTROMETRIC DATA PROCESSING PROGRAM
- Patent Title (中): 质谱法,质谱法和质谱数据处理程序
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Application No.: US15039924Application Date: 2013-11-28
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Publication No.: US20170032947A1Publication Date: 2017-02-02
- Inventor: Yuko KOBAYASHI , Tairo OGURA
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto-shi, Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto-shi, Kyoto
- International Application: PCT/JP2013/082007 WO 20131128
- Main IPC: H01J49/00
- IPC: H01J49/00 ; H01J49/42 ; G01N30/72

Abstract:
In a mass spectrometric method of the invention, a mass spectrometer (2) is used having a mass separation unit (231, 234) before and after a collision cell (232) for fragmenting ions. When a product ion corresponding to a precursor ion set for a sample is selected by performing product ion scan with respect to the precursor ion, an exclusion range of mass-to-charge ratios is set based on information on non-selection ions input by a user, and a product ion that satisfies a predefined criterion is selected within a range of mass-to-charge ratios excluding the exclusion range in a product ion spectrum. According to the mass spectrometric method of the invention, product ions suited for measurement on a target compound can be selected.
Public/Granted literature
- US09799499B2 Mass spectrometric method, mass spectrometer, and mass spectrometric data processing program Public/Granted day:2017-10-24
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