Invention Application
- Patent Title: MEMORY DEVICE AND SEMICONDUCTOR DEVICE
- Patent Title (中): 存储器件和半导体器件
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Application No.: US15292362Application Date: 2016-10-13
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Publication No.: US20170033110A1Publication Date: 2017-02-02
- Inventor: Yutaka SHIONOIRI , Hiroyuki MIYAKE , Kiyoshi KATO
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Priority: JP2009-297140 20091228
- Main IPC: H01L27/105
- IPC: H01L27/105 ; H01L27/12 ; H01L29/786

Abstract:
It is an object to provide a memory device whose power consumption can be suppressed and a semiconductor device including the memory device. As a switching element for holding electric charge accumulated in a transistor which functions as a memory element, a transistor including an oxide semiconductor film as an active layer is provided for each memory cell in the memory device. The transistor which is used as a memory element has a first gate electrode, a second gate electrode, a semiconductor film located between the first gate electrode and the second gate electrode, a first insulating film located between the first gate electrode and the semiconductor film, a second insulating film located between the second gate electrode and the semiconductor film, and a source electrode and a drain electrode in contact with the semiconductor film.
Public/Granted literature
- US10797054B2 Memory device and semiconductor device Public/Granted day:2020-10-06
Information query
IPC分类: