Invention Application
US20170066192A1 STRUCTURED LIGHT GENERATING DEVICE AND MEASURING SYSTEM AND METHOD
审中-公开
结构光产生装置和测量系统及方法
- Patent Title: STRUCTURED LIGHT GENERATING DEVICE AND MEASURING SYSTEM AND METHOD
- Patent Title (中): 结构光产生装置和测量系统及方法
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Application No.: US14935601Application Date: 2015-11-09
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Publication No.: US20170066192A1Publication Date: 2017-03-09
- Inventor: Chia-Hung Cho , Hsin-Yi Chen , Yi-Chen Hsieh , Cheng-Ta Mu
- Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Priority: TW104129620 20150908
- Main IPC: B29C67/00
- IPC: B29C67/00 ; G03B21/00 ; G03B21/20 ; G02B27/10
Abstract:
A structured light generating device and a measuring system and method are provided. The structured light generating device includes: a light modulating element for receiving a projection light beam and modulating the projection light beam into a first structured light beam having a pattern, and a light shifting element corresponding to the light modulating element for receiving and shifting the first structured light beam to generate a second structured light beam having the pattern. A shift difference is formed between the first structured light beam and the second structured light beam, and the first structured light beam and the second structured light beam are superimposed to form a superimposed structured light beam so as to improve resolution.
Public/Granted literature
- US10105906B2 Structured light generating device and measuring system and method Public/Granted day:2018-10-23
Information query
