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    TEMPERATURE SENSING APPARATUS, LASER PROCESSING SYSTEM, AND TEMPERATURE MEASURING METHOD
    2.
    发明申请
    TEMPERATURE SENSING APPARATUS, LASER PROCESSING SYSTEM, AND TEMPERATURE MEASURING METHOD 有权
    温度感测装置，激光加工系统和温度测量方法

    公开(公告)号：US20160096236A1

    公开(公告)日：2016-04-07

    申请号：US14504433

    申请日：2014-10-02

    Applicant: Industrial Technology Research Institute

    Inventor： Chia-Hung Cho ,  Yi-Chen Hsieh ,  Kai-Ping Chuang ,  Sen-Yih Chou ,  Chun-Jen Lin

    IPC: B23K26/34 ,  B23K26/067 ,  B23K26/30 ,  G01J5/08 ,  B23K26/03

    CPC classification number: B23K26/342 ,  B22F3/1055 ,  B22F2003/1056 ,  B23K26/032 ,  B23K26/034 ,  B23K26/082 ,  B23K26/707 ,  B29C64/153 ,  B29C67/0077 ,  G01J5/0803 ,  G01J5/0806 ,  G01J5/0828 ,  G01J5/0846 ,  G01J2005/106 ,  Y02P10/295

    Abstract: A temperature sensing apparatus configured to measure a temperature distribution of a surface to be measured is provided. The temperature sensing apparatus includes a lens set, a filtering module, a plurality of sensor arrays, and a processing unit. The lens set is configured to receive radiation from the surface to be measured. The filtering module is configured to filter the radiation from the lens set into a plurality of radiation portions respectively having different wavelengths. The sensor arrays are configured to respectively sense the radiation portions. The processing unit is configured to calculate an intensity ratio distribution of the radiation between the different wavelengths according to the radiation portions respectively sensed by the sensor arrays and determine the temperature distribution according to the intensity ratio distribution. A laser processing system and a temperature measuring method are also provided.

    Abstract translation: 提供了一种被配置为测量待测表面的温度分布的温度感测装置。 温度感测装置包括透镜组，滤光模块，多个传感器阵列和处理单元。 透镜组被配置为从待测量的表面接收辐射。 滤波模块被配置为将来自透镜组的辐射滤波成分别具有不同波长的多个辐射部分。 传感器阵列被配置成分别感测辐射部分。 处理单元被配置为根据由传感器阵列分别感测的辐射部分来计算不同波长之间的辐射的强度比分布，并根据强度比分布确定温度分布。 还提供了激光加工系统和温度测量方法。

    STRUCTURED LIGHT GENERATING DEVICE AND MEASURING SYSTEM AND METHOD
    4.
    发明申请
    STRUCTURED LIGHT GENERATING DEVICE AND MEASURING SYSTEM AND METHOD 审中-公开
    结构光产生装置和测量系统及方法

    公开(公告)号：US20170066192A1

    公开(公告)日：2017-03-09

    申请号：US14935601

    申请日：2015-11-09

    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

    Inventor： Chia-Hung Cho ,  Hsin-Yi Chen ,  Yi-Chen Hsieh ,  Cheng-Ta Mu

    IPC: B29C67/00 ,  G03B21/00 ,  G03B21/20 ,  G02B27/10

    CPC classification number: B33Y50/02 ,  B29C64/153 ,  B29C64/20 ,  B29C64/386 ,  G01B11/2513 ,  G01B11/2527 ,  G02B27/10 ,  G03B21/005

    Abstract: A structured light generating device and a measuring system and method are provided. The structured light generating device includes: a light modulating element for receiving a projection light beam and modulating the projection light beam into a first structured light beam having a pattern, and a light shifting element corresponding to the light modulating element for receiving and shifting the first structured light beam to generate a second structured light beam having the pattern. A shift difference is formed between the first structured light beam and the second structured light beam, and the first structured light beam and the second structured light beam are superimposed to form a superimposed structured light beam so as to improve resolution.

    Abstract translation: 提供了一种结构化光产生装置和测量系统和方法。 结构光产生装置包括：光调制元件，用于接收投影光束并将投影光束调制成具有图案的第一结构化光束;以及与光调制元件对应的光移动元件，用于接收和移位第一 结构化光束以产生具有该图案的第二结构光束。 在第一结构光束和第二结构光束之间形成偏移差，并且第一结构光束和第二结构光束被叠加以形成叠加的结构光束，从而提高分辨率。

    Inspection device and inspection method
    5.
    发明授权
    Inspection device and inspection method 有权
    检验装置及检验方法

    公开(公告)号：US09360436B2

    公开(公告)日：2016-06-07

    申请号：US14079568

    申请日：2013-11-13

    Applicant: Industrial Technology Research Institute

    Inventor： Yi-Chen Hsieh ,  Chih-Jung Chiang ,  Fu-Cheng Yang

    IPC: G01N21/88 ,  G01N21/21 ,  G02B5/30 ,  G01N21/95

    CPC classification number: G01N21/8806 ,  G01N21/21 ,  G01N21/9501 ,  G01N2021/8848 ,  G02B5/3066

    Abstract: The disclosure provides an inspection device including a light source module, an image receiving module and a processing unit. The light source module emits a first incident light and a second incident light to a device under test (DUT). The image receiving module receives a first image corresponding to the DUT irradiated by the first incident light, and receives a second image corresponding to the DUT irradiated by the second incident light. The processing unit calculates the contrast ratio of the first image and the second image to obtain a high-contrast image for inspection.

    Abstract translation: 本发明提供一种包括光源模块，图像接收模块和处理单元的检查装置。 光源模块向待测器件（DUT）发射第一入射光和第二入射光。 图像接收模块接收与由第一入射光照射的DUT对应的第一图像，并且接收与由第二入射光照射的DUT对应的第二图像。 处理单元计算第一图像和第二图像的对比度，以获得用于检查的高对比度图像。

    Temperature sensing apparatus, laser processing system, and temperature measuring method
    7.
    发明授权
    Temperature sensing apparatus, laser processing system, and temperature measuring method 有权
    温度传感装置，激光加工系统和温度测量方法

    公开(公告)号：US09533375B2

    公开(公告)日：2017-01-03

    申请号：US14504433

    申请日：2014-10-02

    Applicant: Industrial Technology Research Institute

    Inventor： Chia-Hung Cho ,  Yi-Chen Hsieh ,  Kai-Ping Chuang ,  Sen-Yih Chou ,  Chun-Jen Lin

    IPC: B23K26/34 ,  B23K26/067 ,  B23K26/30 ,  B23K26/03 ,  G01J5/08 ,  B29C67/00 ,  B22F3/105

    CPC classification number: B23K26/342 ,  B22F3/1055 ,  B22F2003/1056 ,  B23K26/032 ,  B23K26/034 ,  B23K26/082 ,  B23K26/707 ,  B29C64/153 ,  B29C67/0077 ,  G01J5/0803 ,  G01J5/0806 ,  G01J5/0828 ,  G01J5/0846 ,  G01J2005/106 ,  Y02P10/295

    Abstract: A temperature sensing apparatus configured to measure a temperature distribution of a surface to be measured is provided. The temperature sensing apparatus includes a lens set, a filtering module, a plurality of sensor arrays, and a processing unit. The lens set is configured to receive radiation from the surface to be measured. The filtering module is configured to filter the radiation from the lens set into a plurality of radiation portions respectively having different wavelengths. The sensor arrays are configured to respectively sense the radiation portions. The processing unit is configured to calculate an intensity ratio distribution of the radiation between the different wavelengths according to the radiation portions respectively sensed by the sensor arrays and determine the temperature distribution according to the intensity ratio distribution. A laser processing system and a temperature measuring method are also provided.

    Abstract translation: 提供了一种被配置为测量待测表面的温度分布的温度感测装置。 温度感测装置包括透镜组，滤光模块，多个传感器阵列和处理单元。 透镜组被配置为从待测量的表面接收辐射。 滤波模块被配置为将来自透镜组的辐射滤波成分别具有不同波长的多个辐射部分。 传感器阵列被配置成分别感测辐射部分。 处理单元被配置为根据由传感器阵列分别感测的辐射部分来计算不同波长之间的辐射的强度比分布，并根据强度比分布确定温度分布。 还提供了激光加工系统和温度测量方法。

    INSPECTION DEVICE AND INSPECTION METHOD
    8.
    发明申请
    INSPECTION DEVICE AND INSPECTION METHOD 有权
    检查装置和检查方法

    公开(公告)号：US20140168417A1

    公开(公告)日：2014-06-19

    申请号：US14079568

    申请日：2013-11-13

    Applicant: Industrial Technology Research Institute

    Inventor： Yi-Chen Hsieh ,  Chih-Jung Chiang ,  Fu-Cheng Yang

    IPC: G01N21/88 ,  G02B5/30

    CPC classification number: G01N21/8806 ,  G01N21/21 ,  G01N21/9501 ,  G01N2021/8848 ,  G02B5/3066

    Abstract: The disclosure provides an inspection device including a light source module, an image receiving module and a processing unit. The light source module emits a first incident light and a second incident light to a device under test (DUT). The image receiving module receives a first image corresponding to the DUT irradiated by the first incident light, and receives a second image corresponding to the DUT irradiated by the second incident light. The processing unit calculates the contrast ratio of the first image and the second image to obtain a high-contrast image for inspection.

    Abstract translation: 本发明提供一种包括光源模块，图像接收模块和处理单元的检查装置。 光源模块向待测器件（DUT）发射第一入射光和第二入射光。 图像接收模块接收与由第一入射光照射的DUT对应的第一图像，并且接收与由第二入射光照射的DUT对应的第二图像。 处理单元计算第一图像和第二图像的对比度，以获得用于检查的高对比度图像。

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