Invention Application
- Patent Title: METHODS TO INTRODUCE SUB-MICROMETER, SYMMETRY-BREAKING SURFACE CORRUGATION TO SILICON SUBSTRATES TO INCREASE LIGHT TRAPPING
-
Application No.: US15389936Application Date: 2016-12-23
-
Publication No.: US20170110602A1Publication Date: 2017-04-20
- Inventor: Sang Eon Han , Brittany R. Hoard , Sang M. Han , Swapnadip Ghosh
- Applicant: STC.UNM
- Applicant Address: US NM Albuquerque
- Assignee: STC.UNM
- Current Assignee: STC.UNM
- Current Assignee Address: US NM Albuquerque
- Main IPC: H01L31/0236
- IPC: H01L31/0236 ; G02B1/00 ; H01L31/20 ; H01L31/0747 ; H01L31/18

Abstract:
Provided is a method for fabricating a nanopatterned surface. The method includes forming a mask on a substrate, patterning the substrate to include a plurality of symmetry-breaking surface corrugations, and removing the mask. The mask includes a pattern defined by mask material portions that cover first surface portions of the substrate and a plurality of mask space portions that expose second surface portions of the substrate, wherein the plurality of mask space portions are arranged in a lattice arrangement having a row and column, and the row is not oriented parallel to a [110] direction of the substrate. The patterning the substrate includes anisotropically removing portions of the substrate exposed by the plurality of spaces.
Public/Granted literature
Information query
IPC分类: