- 专利标题: SAMPLE HOLDER, DEVICE AND METHOD FOR DETACHING OF A FIRST SUBSTRATE
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申请号: US15318790申请日: 2014-06-27
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公开(公告)号: US20170133243A1公开(公告)日: 2017-05-11
- 发明人: Erich Thallner
- 申请人: Erich Thallner
- 国际申请: PCT/EP2014/063687 WO 20140627
- 主分类号: H01L21/67
- IPC分类号: H01L21/67 ; B32B43/00 ; B32B37/08 ; H01L21/687 ; H01L21/683
摘要:
A method and device for detaching a first substrate, which is connected to a second substrate by an interconnect layer, from the second substrate by embrittlement of the interconnect layer. A method for bonding of a first substrate to a second substrate with an interconnect layer which can be embrittled by cooling. A use of a material which can be embrittled for producing an interconnect layer between first and second substrate for forming a substrate stack. A substrate stack, formed from a first substrate, a second substrate and an interconnect layer located therebetween, the interconnect layer formed from a material which can be embrittled. A wafer chuck for holding a first substrate when the first substrate is being detached from a second substrate with fixing means which can be activated by lowering the temperature.
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