- 专利标题: METHOD AND SYSTEM FOR IMPROVED MATCHING FOR ON-CHIP CAPACITORS
-
申请号: US14950865申请日: 2015-11-24
-
公开(公告)号: US20170148712A1公开(公告)日: 2017-05-25
- 发明人: Weizhong Cai , Kimihiko Imura , Wei Gu
- 申请人: Maxlinear, Inc.
- 主分类号: H01L23/495
- IPC分类号: H01L23/495 ; H01L21/48
摘要:
Methods and systems for improved matching of on-chip capacitors may comprise a semiconductor die with an on-chip capacitor comprising one or more metal layers. The on-chip capacitor may comprise interdigitated electrically coupled metal fingers. The electrically coupled metal fingers may be arranged symmetrically in the semiconductor die to compensate for non-uniformities in the one or more metal layers. The metal fingers may be arranged with radial symmetry. Metal fingers in a first metal layer may be electrically coupled to metal fingers in a second metal layer. An orientation of metal fingers may be alternated when coupling metal fingers in a plurality of metal layers. The metal fingers may be coupled at the center or the outer edge of the on-chip capacitor. The on-chip capacitor may be configured in a plurality of symmetric sections wherein a boundary between each of the plurality of sections is configured in a zig-zag pattern.
公开/授权文献
信息查询
IPC分类: