Invention Application
- Patent Title: DATA COMPARISON CIRCUIT AND SEMICONDUCTOR DEVICE
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Application No.: US15432002Application Date: 2017-02-14
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Publication No.: US20170244398A1Publication Date: 2017-08-24
- Inventor: Yuki OKAMOTO , Yoshiyuki KUROKAWA
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Priority: JP2016-031740 20160223
- Main IPC: H03K5/24
- IPC: H03K5/24

Abstract:
A semiconductor device that enables a memory size reduction is provided. The semiconductor device includes a converter circuit, a memory circuit, and a detection circuit. The converter circuit has a function of converting first data that includes a digital voltage value to second data that includes an analog current value. The memory circuit has a function of storing third data that includes an analog current value. The detection circuit has a function of generating data that indicates whether the analog current values of the second and third data match.
Public/Granted literature
- US10305460B2 Data comparison circuit and semiconductor device Public/Granted day:2019-05-28
Information query
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