Invention Application
- Patent Title: SHAPE INSPECTION APPARATUS FOR METALLIC BODY AND SHAPE INSPECTION METHOD FOR METALLIC BODY
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Application No.: US15514368Application Date: 2016-06-01
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Publication No.: US20170276476A1Publication Date: 2017-09-28
- Inventor: Yusuke KONNO , Toshio AKAGI , Hironao YAMAJI , Jun UMEMURA
- Applicant: NIPPON STEEL & SUMITOMO METAL CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NIPPON STEEL & SUMITOMO METAL CORPORATION
- Current Assignee: NIPPON STEEL & SUMITOMO METAL CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2015-114539 20150605
- International Application: PCT/JP2016/066159 WO 20160601
- Main IPC: G01B11/24
- IPC: G01B11/24 ; H04N9/07 ; H04N5/225 ; G01C9/02

Abstract:
To inspect the shape of a metallic body further accurately, regardless of surface roughness of the metallic body. A shape inspection apparatus for a metallic body according to the present invention includes: a measurement apparatus configured to irradiate a metallic body with at least two illumination light beams, and measure reflected light of the two illumination light beams from the metallic body separately; and an arithmetic processing apparatus configured to calculate information used for shape inspection of the metallic body on the basis of luminance values of the reflected light. The measurement apparatus includes a first illumination light source and a second illumination light source configured to irradiate the metallic body with strip-shaped illumination light having mutually different peak wavelengths, and a color line sensor camera configured to measure reflected light of first illumination light and reflected light of second illumination light, separately. The first illumination light source and the second illumination light source are provided in a manner that their optical axes form substantially equal angles with a direction of regular reflection of an optical axis of the color line sensor camera at a surface of the metallic body. A wavelength difference between a peak wavelength of the first illumination light and a peak wavelength of the second illumination light is equal to or more than 5 nm and equal to or less than 90 nm.
Public/Granted literature
- US09903710B2 Shape inspection apparatus for metallic body and shape inspection method for metallic body Public/Granted day:2018-02-27
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