公开(公告)号：US20180180405A1

公开(公告)日：2018-06-28

申请号：US15738499

申请日：2017-05-19

Applicant: NIPPON STEEL & SUMITOMO METAL CORPORATION

Inventor： Yusuke KONNO ,  Takamichi KOBAYASHI ,  Toshio AKAGI ,  Atsuhiro HIBI ,  Nobuhiro FURUYA ,  Akihito NAKAZAKI

IPC: G01B11/24 ,  G01N21/89 ,  G01B11/26

CPC classification number: G01B11/24 ,  G01B11/26 ,  G01B11/303 ,  G01B11/306 ,  G01N21/8901 ,  G01N21/892 ,  G01N2021/8908 ,  G01N2021/8918 ,  G01N2201/062

Abstract: [Object] To measure a surface shape of a strip-shaped body made of a metallic body at higher speed with higher precision while suppressing occurrence of speckle noise.[Solution] A shape measurement apparatus according to the present invention includes: a linear light source that includes a superluminescent diode and applies linear light spreading in a width direction of the strip-shaped body to a surface of the strip-shaped body; a screen on which reflected light of the linear light off the surface of the strip-shaped body is projected; an area camera that captures an image of the reflected light of the linear light projected on the screen; and an arithmetic processing apparatus that calculates the surface shape of the strip-shaped body using the captured image of the reflected light of the linear light captured by the area camera. The linear light source has a spectral half-width of 20 nm or more, and is placed in a manner that an angle θ formed by an optical axis of the linear light source and a direction normal to the surface of the strip-shaped body and a wavelength λ of the linear light satisfy Formula (I) related to specularity of the strip-shaped body.

公开(公告)号：US20180174316A1

公开(公告)日：2018-06-21

申请号：US15514311

申请日：2016-04-08

Applicant: NIPPON STEEL & SUMITOMO METAL CORPORATION

Inventor： Toshio AKAGI ,  Yusuke KONNO ,  Hironao YAMAJI ,  Jun UMEMURA

IPC: G06T7/507 ,  G01B11/24 ,  G06T7/40 ,  H04N7/18 ,  G06F17/11 ,  G01J3/50

CPC classification number: G06T7/507 ,  G01B11/24 ,  G01B11/30 ,  G01J3/50 ,  G01N21/8901 ,  G01N21/892 ,  G01N2021/8908 ,  G01N2021/8918 ,  G06F17/11 ,  G06T7/40 ,  H04N7/18

Abstract: [Object] To monitor, on a metallic body surface, a region that has a specific hue and a region that does not have the specific hue and has a surface whose roughness varies.[Solution] Included are: a measurement apparatus which includes a line sensor camera which is provided such that an optical axis of the line sensor camera is substantially parallel to a normal direction of a metallic body surface, and first, second, and third illumination light sources each configured to irradiate the metallic body surface with first, second, and third illumination light beams each having a strip shape, the measurement apparatus being configured to measure separately respective reflected light beams of the three illumination light beams that have been emitted; and an arithmetic processing apparatus configured to calculate surface state monitoring information on the basis of luminance values of the reflected light beams. The second and third illumination light sources are provided such that a second angle between an optical axis of the second illumination light source and the optical axis of the line sensor camera is substantially equal to a third angle between an optical axis of the third illumination light source and the optical axis of the line sensor camera, and the first illumination light source is provided such that a first angle between the optical axis of the line sensor camera and an optical axis of the first illumination light source is larger than the second angle. The arithmetic processing apparatus calculates information on a hue of the metallic body surface on the basis of a luminance value of the reflected light beam of the first illumination light beam and information on surface roughness of the metallic body on the basis of luminance values of the respective reflected light beams of the second and third illumination light beams.

公开(公告)号：US20170016832A1

公开(公告)日：2017-01-19

申请号：US15123856

申请日：2015-02-19

Applicant: NIPPON STEEL & SUMITOMO METAL CORPORATION

Inventor： Jun UMEMURA ,  Toshio AKAGI

IPC: G01N21/86 ,  G01N21/25 ,  G01B11/24 ,  G06T7/00

CPC classification number: G01N21/86 ,  G01B11/24 ,  G01J3/504 ,  G01N21/251 ,  G01N21/255 ,  G01N21/8914 ,  G01N21/892 ,  G01N33/20 ,  G01N2021/8455 ,  G01N2201/062 ,  G01N2201/12 ,  G06T7/0004 ,  G06T2207/10004 ,  G06T2207/10024 ,  G06T2207/30136

Abstract: [Object] To integratively index a surface property of a measured object by utilizing a measurement result at a plurality of illumination wavelengths and measurement angles.[Solution] A surface property indexing apparatus according to the present invention includes a measurement device that generates a plurality of captured images by capturing images of reflected light of illumination light on a surface of the measured object while selecting its wavelength, and an arithmetic processing apparatus that indexes a surface property of the measured object on the basis of the obtained captured images. The captured images generated by the measurement device are of the same wavelength of the reflected light that forms images in an image capturing device, and is of different reflection angles of the reflected light that forms images in the image capturing device in the direction corresponding to the longitudinal direction of the measured object in the captured image. The arithmetic processing apparatus reconstructs the generated captured images to generate a plurality of processing target images having a common wavelength of the reflected light and a common reflection angle of the reflected light and composed of pixels corresponding to the different view field positions of the measured object, and indexes the surface property of the measured object on the basis of the generated processing target images.

Abstract translation: [解决方案]根据本发明的表面特性分度装置包括：测量装置，其通过在选择其波长的同时拍摄被测量物体的表面上的照明光的反射光的图像来生成多个拍摄图像;以及运算处理装置 其基于所获得的捕获图像来对所测量的对象的表面特性进行索引。 由测量装置产生的拍摄图像具有在图像捕获装置中形成图像的反射光的相同波长，并且在对应于图像捕获装置的方向上在图像捕获装置中形成图像的反射光的反射角度不同 拍摄图像中测量对象的纵向方向。 算术处理装置重建所生成的拍摄图像，以生成具有反射光的公共波长和反射光的共同反射角并且由对应于被测量物体的不同视场位置的像素构成的多个处理对象图像， 并根据所生成的处理对象图像对被测量物体的表面特性进行索引。

公开(公告)号：US20180292203A1

公开(公告)日：2018-10-11

申请号：US15767081

申请日：2017-01-19

Applicant: NIPPON STEEL & SUMITOMO METAL CORPORATION

Inventor： Toshio AKAGI ,  Yusuke KONNO ,  Atsuhiro HIBI ,  Nobuhiro FURUYA ,  Takayuki SONODA ,  Akihito NAKAZAKI

IPC: G01B11/30 ,  G01B11/24

Abstract: [Object] To provide a shape measurement apparatus that is capable of detecting minute roughness irregularity at high speed across the entire width on the entire surface of a measurement object.[Solution] Provided is a shape measurement apparatus including: a light source configured to irradiate a surface of a moving strip-shaped body with linear light diagonally from an upstream side in a movement direction of the strip-shaped body; a screen configured such that reflected light of the linear light on the surface of the strip-shaped body is projected on the screen; an imaging unit configured to image the reflected light of the linear light projected on the screen; and an arithmetic processing unit configured to acquire surface roughness distribution of the strip-shaped body on the basis of width distribution of a light strip of the reflected light of the linear light projected on the screen. The angle of incidence of the light source with respect to the strip-shaped body is set in accordance with target surface roughness of the surface of the strip-shaped body.

公开(公告)号：US20180283850A1

公开(公告)日：2018-10-04

申请号：US15559681

申请日：2016-12-20

Applicant: NIPPON STEEL & SUMITOMO METAL CORPORATION

Inventor： Atsuhiro HIBI ,  Yusuke KONNO ,  Toshio AKAGI ,  Nobuhiro FURUYA ,  Tomohiro KUROIWA ,  Akihito NAKAZAKI

IPC: G01B11/24

CPC classification number: G01B11/24 ,  G01B11/306

Abstract: [Object] To provide a shape measurement apparatus that is capable of measuring the amount of warpage in the width direction of a strip-shaped body with higher sensitivity.[Solution] Provided is a shape measurement apparatus including: a light source configured to irradiate a surface of a moving strip-shaped body with linear light at a prescribed angle of incidence; a screen configured such that reflected light of the linear light on the surface of the strip-shaped body is projected on the screen; an imaging unit configured to image the reflected light of the linear light projected on the screen; and an arithmetic processing unit configured to acquire the amount of warpage in a width direction of the strip-shaped body on the basis of a line length of the reflected light of the linear light imaged by the imaging unit.

公开(公告)号：US20180202941A1

公开(公告)日：2018-07-19

申请号：US15564154

申请日：2016-12-19

Applicant: NIPPON STEEL & SUMITOMO METAL CORPORATION

Inventor： Yusuke KONNO ,  Takamichi KOBAYASHI ,  Toshio AKAGI ,  Atsuhiro HIBI ,  Nobuhiro FURUYA ,  Akihito NAKAZAKI

IPC: G01N21/88 ,  G01N21/892

CPC classification number: G01N21/8806 ,  G01N15/06 ,  G01N21/00 ,  G01N21/359 ,  G01N21/88 ,  G01N21/8851 ,  G01N21/892 ,  G01N21/94 ,  G01N21/952 ,  G01N2201/0697

Abstract: [Object] To find, with high sensitivity, an unevenness defect or the like that has occurred on the surface of an inspection object having a surface roughness comparable to wavelengths of visible light and is comparable to several times the surface roughness, and accurately distinguish between dirt and an unevenness flaw present on the surface of the inspection object, and also enable a reduction in the size of an apparatus.[Solution] An inspection object imaging apparatus according to the present invention includes: a light source configured to produce a light beam belonging to an infrared wavelength band and having a predetermined spread half-angle on a surface of an inspection object; a projection optical system configured to project the light beam on the surface of the inspection object at a predetermined projection angle; and an imaging unit configured to image reflected light from the surface of the inspection object. The imaging unit includes an imaging optical system including at least one convex lens, configured to condense reflected light and branch the reflected light to two different directions, and a first image sensor and a second image sensor each configured to image the reflected light that has passed through the imaging optical system. The first image sensor is positioned on the inspection object side with respect to a position of the imaging optical system that is conjugate with the surface of the inspection object, along an optical axis of the reflected light. The second image sensor is positioned on the reflected-light travel direction side with respect to the conjugate position.

公开(公告)号：US20180087898A1

公开(公告)日：2018-03-29

申请号：US15510827

申请日：2016-05-24

Applicant: NIPPON STEEL & SUMITOMO METAL CORPORATION

Inventor： Toshio AKAGI ,  Yusuke KONNO ,  Hironao YAMAJI ,  Jun UMEMURA

IPC: G01B11/25 ,  G01B11/245 ,  G01B11/26

CPC classification number: G01B11/2509 ,  G01B11/245 ,  G01B11/26 ,  G01N21/86 ,  G01N21/8903 ,  G01N21/8914 ,  G01N21/892 ,  G01N2021/8636 ,  G01N2021/8908 ,  G01N2021/8918 ,  G06T7/0004 ,  G06T7/521 ,  G06T7/586 ,  G06T2207/10024 ,  G06T2207/10152 ,  G06T2207/30136

Abstract: [Object] To perform shape inspection of a metallic body in a simple way at higher speed with higher density.[Solution] An apparatus of the present invention includes: a measurement apparatus configured to irradiate a metallic body with at least two illumination light beams, and measure reflected light separately; and an arithmetic processing apparatus configured to calculate information used for shape inspection of the metallic body on the basis of measurement results. The measurement apparatus includes a plurality of illumination light sources configured to emit strip-shaped illumination light having different peak wavelengths, and a plurality of monochrome line sensor cameras that have band-pass filters and are aligned vertically above a surface of the metallic body and set to capture images of the same portion of the metallic body by their respective shift lenses, the number of the monochrome line sensor cameras being the same as the number of the peak wavelengths of the emitted illumination light. At least two of the plurality of illumination light sources are provided in a manner that an angle formed by a normal direction to the surface of the metallic body and an optical axis of the first illumination light source is substantially equal to an angle formed by the normal direction and an optical axis of the second illumination light source and the two illumination light sources face each other with the line sensor cameras therebetween in a relative movement direction of the metallic body and the measurement apparatus.

公开(公告)号：US20170276476A1

公开(公告)日：2017-09-28

申请号：US15514368

申请日：2016-06-01

Applicant: NIPPON STEEL & SUMITOMO METAL CORPORATION

Inventor： Yusuke KONNO ,  Toshio AKAGI ,  Hironao YAMAJI ,  Jun UMEMURA

IPC: G01B11/24 ,  H04N9/07 ,  H04N5/225 ,  G01C9/02

CPC classification number: G01B11/24 ,  G01B11/2509 ,  G01B11/26 ,  G01C9/02 ,  G01N21/86 ,  G01N21/8901 ,  G01N21/8914 ,  G01N21/892 ,  G01N2021/8636 ,  G01N2021/8908 ,  G01N2021/8918 ,  G06T7/0004 ,  G06T7/521 ,  G06T2207/10024 ,  G06T2207/10152 ,  G06T2207/30136 ,  H04N5/2256 ,  H04N9/07

Abstract: To inspect the shape of a metallic body further accurately, regardless of surface roughness of the metallic body. A shape inspection apparatus for a metallic body according to the present invention includes: a measurement apparatus configured to irradiate a metallic body with at least two illumination light beams, and measure reflected light of the two illumination light beams from the metallic body separately; and an arithmetic processing apparatus configured to calculate information used for shape inspection of the metallic body on the basis of luminance values of the reflected light. The measurement apparatus includes a first illumination light source and a second illumination light source configured to irradiate the metallic body with strip-shaped illumination light having mutually different peak wavelengths, and a color line sensor camera configured to measure reflected light of first illumination light and reflected light of second illumination light, separately. The first illumination light source and the second illumination light source are provided in a manner that their optical axes form substantially equal angles with a direction of regular reflection of an optical axis of the color line sensor camera at a surface of the metallic body. A wavelength difference between a peak wavelength of the first illumination light and a peak wavelength of the second illumination light is equal to or more than 5 nm and equal to or less than 90 nm.