Invention Application
- Patent Title: Methods for Detecting Genetic Variations
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Application No.: US15607235Application Date: 2017-05-26
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Publication No.: US20170342477A1Publication Date: 2017-11-30
- Inventor: Taylor Jacob Jensen , Mathias Ehrich , Dirk van den Boom , John Allen Tynan , Sung Kyun Kim , Timothy S. Burcham , Christopher K. Ellison , Youting Sun
- Applicant: Sequenom, Inc.
- Applicant Address: US CA San Diego
- Assignee: Sequenom, Inc.
- Current Assignee: Sequenom, Inc.
- Current Assignee Address: US CA San Diego
- Main IPC: C12Q1/68
- IPC: C12Q1/68 ; C40B30/02 ; G06F19/22 ; G06F19/20

Abstract:
Technology provided herein relates in part to methods, processes, machines and apparatuses for detecting genetic variations. In some embodiments, the technology is related to non-invasive assessment of aneuploidies.
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