Invention Application
- Patent Title: GRAPH METHOD FOR SYSTEM SENSITIVITY ANALYSES
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Application No.: US15165144Application Date: 2016-05-26
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Publication No.: US20170344558A1Publication Date: 2017-11-30
- Inventor: Chia-Yu Chen , Pei-Yun Hsueh , Jui-Hsin Lai , Yinglong Xia
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Main IPC: G06F17/30
- IPC: G06F17/30

Abstract:
A computer-implemented method, computer program product, and system for determination of critical parts and component correlations in a circuit using a correlation graph and centrality analysis including; receiving a circuit layout portion of a larger circuit layout, converting the circuit layout portion into a correlation graph representing components as nodes and connecting wires as edges, determining, using ground truth and Naïve Bayes to determine correlation weighting, scaling the correlation graph to represent the larger circuit, and presenting the larger correlation graph on a graphical user interface (GUI).
Public/Granted literature
- US10552486B2 Graph method for system sensitivity analyses Public/Granted day:2020-02-04
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