Invention Application
- Patent Title: HIGH RELIABILITY HOUSING FOR A SEMICONDUCTOR PACKAGE
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Application No.: US15679373Application Date: 2017-08-17
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Publication No.: US20170345859A1Publication Date: 2017-11-30
- Inventor: Yu-Te HSIEH
- Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Applicant Address: US AZ Phoenix
- Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee Address: US AZ Phoenix
- Main IPC: H01L27/146
- IPC: H01L27/146 ; H01L25/16

Abstract:
Implementations of semiconductor packages may include: a substrate coupled to one or more die and to one or more connectors, a glass lid coupled over one or more die by an adhesive and a housing comprising one or more sides and a bottom opening and a top opening. The substrate may be coupled to the housing at the bottom opening and the glass lid may be coupled under the housing at the top opening.
Public/Granted literature
- US10181487B2 High reliability housing for a semiconductor package Public/Granted day:2019-01-15
Information query
IPC分类: