Invention Application
- Patent Title: INTEGRATED CIRCUIT STRUCTURE HAVING DEEP TRENCH CAPACITOR AND THROUGH-SILICON VIA AND METHOD OF FORMING SAME
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Application No.: US15171320Application Date: 2016-06-02
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Publication No.: US20170352618A1Publication Date: 2017-12-07
- Inventor: John A. Fitzsimmons , Mukta G. Farooq , Anthony K. Stamper
- Applicant: GLOBALFOUNDRIES INC.
- Main IPC: H01L23/522
- IPC: H01L23/522 ; H01L23/498 ; H01L21/48 ; H01L49/02

Abstract:
One aspect of the disclosure relates to an interposer. The interposer may include: a first dielectric layer extending from a substrate in a direction away from a front side of the substrate; a back-end-of-the-line (BEOL) region extending from the substrate in a direction away from the back side of the substrate; a deep trench (DT) capacitor within the substrate and extending toward a back side of the substrate, the DT capacitor having a first portion within the substrate and a second portion within the first dielectric layer; and a through silicon via (TSV) adjacent to the DT capacitor and extending through the first dielectric layer, the substrate, and the BEOL region.
Public/Granted literature
Information query
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